Credibility built on market-proven technology.
Technology developed in order to meet market needs has been contributing in the production lines around the world.
Born out of the need for high-speed, high-accuracy measurement/ inspection of fast-evolving electronic components, NIDEC-READ products reflect the culmination of our longstanding experiences in a variety of elemental technologies. Our technical portfolio today realizes extensive application in:
- mission-critical, high-performance integrated circuits and associated software
- hardware design enabling submicron control
- component fixture operation for processing and assembling multi-pin and narrow-pitch chips, and
- two- and three-dimensional optical imaging and three-dimensional process technology
NIDEC-READ’s main strength derives from the ability to blend a wide range of elemental technologies to the industry's highest level of performance.
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA). NIDEC-READ offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. NIDEC-READ provides open/leak inspection system for touch screen panel and LCD, at singulated size to multifaced size, making use of our diversed contact & non-contact technologies.
Semiconductor Package Inspection System/Printed Circuit Board Inspection System/TSP and FPD Inspection System
NIDEC-READ testers undertake various types of continuity tests at broad voltage and resistance levels.
In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within photomasks and inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
Our probe cards are a perfect solution for advanced wafer testing challenges.
NIDEC-READ's auto parts inspection systems and specific application systems collectively support the customers' productivity improvement by working in their process lines around open/leak the current test and post-packaging.